Park Systems XEI is a specialized image processing and analysis application for Atomic Force Microscopy and other scanning probe microscopy data. It offers comprehensive tools for artifact correction (plane and line leveling, background subtraction), filtering, and high-quality 2D/3D visualization. Quantitative analysis features include line profiles, step-height measurements, particle and grain analysis, surface roughness statistics (Ra, RMS, and more), histograms, FFT/PSD, and surface area calculations. XEI reads native Park Systems files and many common SPM formats, and it exports publication-ready images and numerical results. Designed for research and industrial labs across materials science, semiconductors, polymers, and life sciences, it streamlines the workflow from raw topography to trustworthy, report-ready insights.
Park Systems XEI is developed by Park Systems Corp. and is used by 1 user of Software Informer. The most popular versions of this product among our users are: 1.7, 1.8 and 4.3. The name of the program executable file is XEI.exe.
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